ProSEM Webinar on Metrology II

We are pleased to announce the 2nd series of our ProSEM Webinar. Due to a lot of positive feedback and high demand from those who missed it the first time,  we're offering another opportunity to explore both established and new features for SEM image metrology. This includes advanced feature detection and measurements employing contour extraction, new capabilities for analysis of arrays or edge roughness, layout-based applications for placement analysis or process modeling, and recipes for batch processing of image sets.

To present the metrology capabilities of ProSEM, we would like to invite you to a 45 minute webinar followed by a Q&A session.

Considering the different time zones, we will hold the webinar at different timeslots for European/Asian attendees and USA/European attendees:

Webinar ProSEM USA/EU:   Wednesday, October 2, 2024 at              9:00am PDT / 12:00pm EDT / 6:00pm CEST

Platform: Microsoft TEAMS

(The link will be sent after registration, shortly before the webinar)

REGISTRATION

ProSEM Webinar USA/EU:   REGISTRATION HERE

We look forward to welcoming you to our ProSEM Webinar!