Using Loop module in BEAMER

Motivation:

The fabrication of microstructures requires tweaking different parameters before getting the optimal conditions for a final product. This experimental testing can be time and material consuming. Accordingly, the simulation of such devices gives the possibility to modify a layout providing relevant information in a fraction of time.  Particularly, the loops give a simple way to introduce small changes in every layout iteration.

Solution:

BEAMER incorporates a loop module that results in a much faster and wider range of testing conditions for a single layout. The loop module is used to iteratively vary and optimise parameters; this to achieve the optimal chip design and warranty the best fabrication results.